Goepel CASCON GALAXY

  • Industry-leading CASCON GALAXY software and SCANFLEX hardware
  • Support for up to 8 individual and independent scan chains
  • Design For Test Analysis and Test Coverage Analysis
  • Stand-alone and/or integrated with Flying Probe Test
  • JTAG controlled test and in-system programming, included
    • Detection and diagnosis of opens, shorts, and stuck-at Programming of Flash, serial EEPROM, CPLD, on-chip memory
    • Mixed signal test
    • Test of peripheral interfaces on the unit under test
    • JTAG controlled dynamic tests through VarioTAP
  • Custom test development in addition to ATPG, including access to on-chip test instruments, such as Built-In Self Test